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 ID Function OEM Model Description
Qty
 Price Status
 7048 非接觸式三次元量測儀 Nanofocus microScan AF2000 3D non-contact surface measurement.
利用二極體雷射進行表面3D量測:
1.自動對焦。
2.Z軸自動對焦範圍:1.5mm.
3.Z軸對焦範圍內最大解析:0.025um
4.光點大小:1um.
5.工作距離:2/5mm.
6.線性(%) < 0.08
1
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Contact for this equipment: sales@semicon-equip.com