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| ID | Function | OEM | Model | Description | Qty |
Price | Status |
| 6297 | Four-point probe mapping system 四點探針 | Four Dimensions, Inc. | 280 SI | 四點探針檯 : 半導體層、雜質擴散層或離子佈植層電阻係數的量測及繪圖。利用兩點電流兩點電壓量測薄膜或矽晶圓之表面片電阻。 Vintage:2003 The for point probe, 4pp Model 280 CI with auto-mapping function, is the instrument to measure the sheet resistance of the silicon chip . It is a versatile tool to measure the sheet resistance of the epi layer, chip surface with ion implantation and the thin metal layer. Wafer or square wafer maximum size：8" wafer or 6" x 6" square wafer Sheet resistance range：1mΩ/square ~ 800KΩ/square |
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Contact for this equipment: sales@semicon-equip.com
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